Abstract Views :287 |
PDF Views:0
Authors
Affiliations
1 Department of Genetics and Plant Breeding, C.S. Azad University of Agriculture and Technology, Kanpur (U.P.), IN
2 Department of Genetics and Plant Breeding, C.S. Azad University of Agriculture and Technology, Kanpur, U.P., IN
Source
International Journal of Agricultural Sciences, Vol 9, No 2 (2013), Pagination: 480-485
Abstract
The stability of 10 parents and their 45 F1s and 45 F2s of wheat were studied for days to 75%flowering, number of ear bearing tillers, plant height, spike length/plant, number of grains/spike, grain weight/spike, days to maturity and grain yield/plant at three diverse locations of Uttar Pradesh, India. The st 784-3 x K 9107, DL 784-3 x K 9644, K 9107 x K 9644, K 8027 x C 306, K 8027 x K 9644, C 306 x K 9644 and GW 373 x K 9644 were identified as stable and high yielder across environments in both the generations. These crosses can be exploited in further breeding programmes for developing high yielding stable varieties.
Keywords
Wheat, Grain, Yield, Stability
